Automotive Event
16th Asia Power Technology Development Forum
Learn how to maximize ATE throughput
Automated test equipment (ATE) OEMs are finding it more difficult to drive down the “cost of test” while trying to keep up with increasing innovation. ATE test system design needs to meet the ever-increasing IC demand quickly and reliably, and minimize costs. Vicor will explain how to maximize throughput in the smallest floor footprint.
Vicor will present at the Asia Power Technology Development Forum
December 6
14:40 to 15:10 PM
3F, Renaissance Shenzhen Bay Hotel
High density DC–DC power modules maximizes ATE throughput
Presented by Mao Min, Field Applications Engineer, Vicor
You will learn how to design the optimal power system solution for ATE which can be widely used in worldwide high end ATE. Vicor’s patented technology and advanced manufacturing process enable designers to achieve a low profile, high efficiency and high power density that will boost throughput.
Mao Min joined Vicor in 2015 as a Field Application Engineer and he’s responsible for technical support and product promotion in South China. He is engaged in the development of power supplies and the application of power IC after graduation from the Department of Applied Electronics at Zhejiang University in 2003. Mao Min worked in Philips, Semtech, Micrel, Microchip before joining Vicor.
48V化で電力が増やせる
Asia Power Technology Development Forum
The WCX™ World Congress Experience is where the engineering community convenes on mobility’s biggest hurdles from mass deployment of electric vehicles to developmental timelines for autonomous vehicles to understating of global supply chain constraints impacting the automotive industry. World Congress Experience is an event of the Society of Automotive Engineers (SAE). Register for the event.