Increasing demands for more efficient test capacity on the factory floor

Semiconductor manufacturers are placing greater demands on Automatic Test Equipment (ATE) companies to design test systems that will meet the ever-increasing IC demand as quickly and reliably – and with as little added cost as possible.

IC manufacturers consider Cost of Test (CoT) as a cost adder that, while required and necessary, only subtracts from product margins, requires ever increasing factory floorspace and does not improve cycle time and yield.

ATE system manufacturers need to develop test systems that meet the technical needs of new IC products and don’t contribute to yield loss and take up the same or less factory floorspace as the generation being replaced.